Microwave Atomic Force Microscopy : Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale
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概要
- 論文の詳細を見る
- 2012-01-25
著者
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JU Yang
Department of Mechanical Engineering, Tohoku University
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Zhang Lan
Department Of Computer Science And Systems Engineering Faculty Of Engineering Yamaguchi University
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Ju Yang
Department Of Mechanical Science And Engineering Nagoya University
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HOSOI Atsushi
Department of Mechanical Science and Engineering, Nagoya University
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FUJIMOTO Akifumi
Department of Mechanical Science and Engineering, Nagoya University
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Hosoi Atsushi
Department Of Mechanical Science And Engineering Nagoya University
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Fujimoto Akifumi
Department Of Mechanical Science And Engineering Nagoya University
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