Optical Line Scan Inspection System for Pseudo-particle Analysis

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概要

• 論文の詳細を見る

• A pseudo-particle size analysis instrument by optical line scan technology has been developed. The developed system composes of four major modules, which are materials feeding module, image acquired module, vision procession module and control unit. The main advantages of this system include total analysis without overlapping or missing of slipping particles, and pseudo-particle separation without breaking the granulation structure. The information gathered from the results covers pseudo-particle size distribution, mean size, roundness, sphericity, and uniformity. This is a powerful instrument for any kinds of small particle analysis.

• 社団法人 日本鉄鋼協会の論文
• 2007-09-15

著者

• CHEN Yu-Cheng

  Department of Materials Science and Engineering, National Tsing Hua University

• Sun Yi-min

  Department Of Occupational Safety And Health Chung Hwa University Of Medical Technology

• MOU Jin-Luh

  Steel & Aluminum R&D Department, China Steel Corporation

• LIAO Chih-Wei

  Mechanical Engineering Department, National Taiwan University of Science and Technology

• TARNG Yung-Sing

  Mechanical Engineering Department, National Taiwan University of Science and Technology

• Mou Jin-luh

  Steel & Aluminum R&d Department China Steel Corporation

• Liao Chih-wei

  Mechanical Engineering Department National Taiwan University Of Science And Technology

• Chen Yu-cheng

  Department Of Environmental And Occupational Health Medical College National Cheng Kung University

• Tarng Yung-sing

  Mechanical Engineering Department National Taiwan University Of Science And Technology

関連論文

• Sol-Gel Derived Pb(Zr, Ti)O_3 Heterolayered Films by Single-Annealing
• Application of Orthogonal Array Tests Method to Optimize Operating Conditions for Iron Ore Sintering
• Optical Line Scan Inspection System for Pseudo-particle Analysis
• Sol-Gel Derived Pb(Zr,Ti)O3 Heterolayered Films by Single-Annealing

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