EUV-FEL diffraction imaging of nanostructures at SCSS (EUV SASE-FEL利用の展開)

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概要

• 論文の詳細を見る
• 2010-09-30

著者

• KOHMURA Yoshiki

  RIKEN Harima Institute

• Kohmura Yoshiki

  Riken Spring-8 Center

• PARK Jaehyun

  RIKEN SPring-8 Center

• SONG Changyong

  RIKEN SPring-8 Center

関連論文

• Suppression of Corrugated Boundaries in Multilayer Fresnel Zone Plate for Hard X-Ray Synchrotron Radiation Using Cylindrical Slit
• EUV-FEL diffraction imaging of nanostructures at SCSS (EUV SASE-FEL利用の展開)
• X-ray Diffraction Topography of BaTiO3 at Phase Transition Temperature
• Suppression of Corrugated Boundaries in Multilayer Fresnel Zone Plate for Hard X-Ray Synchrotron Radiation Using Cylindrical Slit

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