Precise Resistivity Measurement of Submicrometer-Sized Materials by Using TEM with Microprobes
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概要
- 論文の詳細を見る
- Japan Institute of Metalsの論文
- 2009-06-01
著者
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SHINDO D.
Institute for Advanced Materials Processing, Tohoku University
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Murakami Y.
Institute for Materials Research, Tohoku University
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Tokumoto H.
Nanotechnology Research Center Research Institute For Electronic Science Hokkaido University
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KAWAMOTO N.
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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AZEHARA H.
Nanotechnology Research Center, Research Institute for Electronic Science, Hokkaido University
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Azehara H.
Nanotechnology Research Center Research Institute For Electronic Science Hokkaido University
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Kawamoto N.
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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