Experimental Evidence of Coexistence of Interface Traps Interacting with Majority and Minority Carriers in Ge MIS Structures

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概要

• 論文の詳細を見る
• 2007-09-19

著者

• SUGIYAMA N.

  MIRAI-ASET

• TAKAGI S.

  MIRAI-AIST

• Taoka N.

  Mirai-asrc

• YAMASHITA Y.

  MIRAI-ASET

• HARADA M.

  MIRAI-ASET

• IKEDA K.

  MIRAI-ASET

• YAMAMOTO T.

  MIRAI-ASET

関連論文

• Experimental Evidence of Coexistence of Interface Traps Interacting with Majority and Minority Carriers in Ge MIS Structures
• Physical Mechanism for Hole Mobility Enhancement in (110)-Surface Strained-Si/Strained-SiGe Structures with Anisotropic/Biaxial Strain

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