Thickness Dependent Nano-Crystallization in Ge_2Sb_2Te_5 films and Its Effect on Devices
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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WEI Xiaoqian
Data Storage Institute, DSI building
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SHI Luping
Data Storage Institute, DSI building
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CHONG Chong
Data Storage Institute, DSI building
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Chong Chong
Data Storage Institute
-
Shi Luping
Data Storage Institute
-
Shi Luping
Data Storage Institute Dsi Building
-
Wei Xiaoqian
Data Storage Institute Dsi Building
-
Chong Chong
Data Storage Institute Dsi Building
関連論文
- Thickness Dependent Nano-Crystallization in Ge_2Sb_2Te_5 films and Its Effect on Devices
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