Effects of Voltage Cycling on Polarization and Reliability of 3D SBT Ferroelectric Capacitors Integrated in 0.18μm CMOS Technology

スポンサーリンク

概要

論文の詳細を見る
2005-09-13

著者

関連論文

Effects of Voltage Cycling on Polarization and Reliability of 3D SBT Ferroelectric Capacitors Integrated in 0.18μm CMOS Technology
Silicon Based System for Single-Nucleotide-Polymorphism Detection : Chip Fabrication and Thermal Characterization of Polymerase Chain Reaction Microchamber (Special Issue : Solid State Devices and Materials (2))

スポンサーリンク