Haspeslagh Luc | Imec Silicon Process And Device Technology Division
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概要
関連著者
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Haspeslagh Luc
Imec Silicon Process And Device Technology Division
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Wouters Dirk
Imec Silicon Process And Device Technology Division
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Zambrano Raffaele
Stmicroelectronics Memory Products Group
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WOUTERS Dirk
IMEC, Silicon Process and Device Technology Division
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GOUX Ludovic
IMEC, Silicon Process and Device Technology Division
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LISONI Judit
IMEC, Silicon Process and Device Technology Division
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MAES David
IMEC, Silicon Process and Device Technology Division
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MEEREN Hans
IMEC, Silicon Process and Device Technology Division
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PARASCHIV Vasile
IMEC, Silicon Process and Device Technology Division
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HASPESLAGH Luc
IMEC, Silicon Process and Device Technology Division
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ARTONI Cesare
STMicroelectronics, Memory Products Group
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CORALLO Giuseppina
STMicroelectronics, Memory Products Group
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Maes David
Imec Silicon Process And Device Technology Division
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Meeren Hans
Imec Silicon Process And Device Technology Division
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Lisoni Judit
Imec Silicon Process And Device Technology Division
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Goux Ludovic
Imec Silicon Process And Device Technology Division
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Artoni Cesare
Stmicroelectronics Memory Products Group
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Paraschiv Vasile
Imec Silicon Process And Device Technology Division
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Corallo Giuseppina
Stmicroelectronics Memory Products Group
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Yamashita Ichiro
Advanced Technology Research Laboratories Matsushita Electric Industrial Co. Ltd.
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Tanaka Hiroyuki
Advanced Technology Research Laboratories, Panasonic Corporation, Seika, Kyoto 619-0237, Japan
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Fiorini Paolo
IMEC vwz., Kapeldreef 75, B-3001 Leuven, Belgium
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Peeters Sara
IMEC vwz., Kapeldreef 75, B-3001 Leuven, Belgium
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Majeed Bivragh
IMEC vwz., Kapeldreef 75, B-3001 Leuven, Belgium
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Beeck Maaike
IMEC vwz., Kapeldreef 75, B-3001 Leuven, Belgium
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Jones Ben
Imec vwz., Kapeldreef 75, B-3001 Leuven, Belgium
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Tezcan Deniz
Imec vwz., Kapeldreef 75, B-3001 Leuven, Belgium
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Tutunjyan Nina
Imec vwz., Kapeldreef 75, B-3001 Leuven, Belgium
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Hoof Chris
Imec vwz., Kapeldreef 75, B-3001 Leuven, Belgium
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Hiraoka Maki
Advanced Technology Research Laboratory, Panasonic Corporation, Seika, Kyoto 619-0237, Japan
著作論文
- Effects of Voltage Cycling on Polarization and Reliability of 3D SBT Ferroelectric Capacitors Integrated in 0.18μm CMOS Technology
- Silicon Based System for Single-Nucleotide-Polymorphism Detection : Chip Fabrication and Thermal Characterization of Polymerase Chain Reaction Microchamber (Special Issue : Solid State Devices and Materials (2))