Study of the electron properties by persistent photoconductive measurement in Ga_xIn_<1-x>N_yAs_<1-y>
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概要
- 論文の詳細を見る
- 2004-09-15
著者
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Su Yan-kuin
National Chen Kung University Institute Of Microelectronics Department Of Electrical Engineering
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Su Yan-kuin
National Cheng Kung University Institute Of Microelectronics Department Of Electrical Engineering
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Chang Shoou-jinn
National Cheng Kung University Institute Of Microelectronics Department Of Electrical Engineering
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HSU Shuo-Hsien
National Cheng Kung University, Institute of Microelectronics, Department of Electrical Engineering
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Hsu Shuo-hsien
National Cheng Kung University Institute Of Microelectronics Department Of Electrical Engineering
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WU Pei-hsuan
National Cheng Kung University, Institute of Microelectronics, Department of Electrical Engineering
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Wu Pei-hsuan
National Cheng Kung University Institute Of Microelectronics Department Of Electrical Engineering
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- Study of the electron properties by persistent photoconductive measurement in Ga_xIn_N_yAs_