Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons
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概要
- 論文の詳細を見る
- Japan Institute of Metalsの論文
- 2007-05-01
著者
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Mika Filip
Institute Of Scientific Instruments Of The Ascr V. V. I.
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Frank Ludek
Institute Of Scientific Instruments Of The Ascr V. V. I.
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Frank Ludek
Institute Of Scientific Instruments Academy Of Sciences Of The Czech Republic
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Frank Ludek
Electron Optics Department Institute Of Scientific Instruments Ascr
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Mullerova Ilona
Institute Of Scientific Instruments Of The Ascr V.v.i.
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Mullerova Ilona
Institute Of Scientific Instruments Academy Of Sciences Of The Czech Republic
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HOVORKA Milos
Institute of Scientific Instruments of the ASCR, v. v. I.
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VALDAITSEV Dimitrii
Institute of Physics, Johannes Gutenberg University
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SCHONHENSE Gerd
Institute of Physics, Johannes Gutenberg University
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Schonhense Gerd
Institute Of Physics Johannes Gutenberg University
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Valdaitsev Dimitrii
Institute Of Physics Johannes Gutenberg University
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Hovorka Milos
Institute Of Scientific Instruments Of The Ascr V. V. I.
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