Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy

スポンサーリンク

概要

• 論文の詳細を見る
• 2006-10-01

著者

• Sato Mitsugu

  Nanotechnology Products Business Group Hitachi High-technologies Corporation

• Sato Mitsugu

  Nanotechnology Products Business Group Hitachi High-technologies Corp.

• Ishitani Tohru

  Nanotechnology Products Business Group Hitachi High-technologies Corporation

関連論文

• Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy
• Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy

スポンサーリンク