Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy
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概要
- 論文の詳細を見る
- 2005-04-01
著者
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Sato Mitsugu
Nanotechnology Products Business Group Hitachi High-technologies Corp.
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Ishitani Tohru
Nanotechnology Products Business Group Hitachi High-technologies Corporation
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KAMIYA Chisato
Nanotechnology Products Business Group, Hitachi High-Technologies Corp.
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Kamiya Chisato
Nanotechnology Products Business Group Hitachi High-technologies Corp.
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Ishitani Tohru
Hitachi High‐technol. Corp. Ibaraki‐ken Jpn
関連論文
- Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy
- Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy