Comparison of Two Reconfigurable N×N Interconnects for a Recurrent Neural Network
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概要
- 論文の詳細を見る
- 1996-12-01
著者
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Collings Neil
Institute Of Microtechnology University Of Neuchatel
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BERGER Christoph
Institute of Microtechnology, University of Neuchatel
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POURZAND Ali
Institute of Microtechnology, University of Neuchatel
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VOLKEL Reinnard
Institute of Microtechnology, University of Neuchatel
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Volkel Reinnard
Institute Of Microtechnology University Of Neuchatel
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Berger Christoph
Institute Of Microtechnology University Of Neuchatel
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Pourzand Ali
Institute Of Microtechnology University Of Neuchatel
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Berger Christoph
Institut für Experimentelle Physik, Otto-von-Guericke-Universität Magdeburg, 39106 Magdeburg, Germany
関連論文
- Comparison of Two Reconfigurable N×N Interconnects for a Recurrent Neural Network
- Systematic Optical Characterization of Two-Dimensional Electron Gases in InAlN/GaN-Based Heterostructures with Different In Content
- Systematic Optical Characterization of Two-Dimensional Electron Gases in InAlN/GaN-Based Heterostructures with Different In Content (Special Issue : Recent Advances in Nitride Semiconductors)