Robustness of Self-Isolation High-Voltage Integrated Circuits against the Voltage Surge during Conductivity Modulation Delay in Free-Wheeling Diode

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概要

• 論文の詳細を見る
• 2007-02-15

著者

• YAMAZAKI Tomoyuki

  Fuji Electric Device Technology Co., Ltd.

• KUMAGAI Naoki

  Fuji Electric Advanced Technology Co., Ltd.

• NISHIURA Akira

  Fuji Electric Device Technology Co., Ltd.

• FUJIHIRA Tatsuhiko

  Fuji Electric Device Technology Co., Ltd.

• MATSUMOTO Takashi

  School of Engineering, University of Yamanashi

関連論文

• Robustness of Self-Isolation High-Voltage Integrated Circuits against the Voltage Surge during Conductivity Modulation Delay in Free-Wheeling Diode
• High-Voltage p-Channel Level Shifter Using Charge-Controlled Self-Isolation Structure

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