Effect of Inner Electrode on Reliability of (Zn,Mg)TiO_3-Based Multilayer Ceramic Capacitor
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-07-15
著者
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Su Chi-yi
Department Of Electrical Engineering National Cheng Kung University
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Lee Ying-chieh
Department Of Materials Engineering National Pin-tong University Of Technology
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LEE Wen-His
Department of Electrical Engineering, National Cheng Kung University
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LEE Ying
R&D Technology Center, Yageo Corporation Nantze Branch
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YANG Jackey
R&D Technology Center, Yageo Corporation Nantze Branch
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YANG Tong
R&D Technology Center, Yageo Corporation Nantze Branch
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PINLIN Shih
R&D Technology Center, Yageo Corporation Nantze Branch
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Pinlin Shih
R&d Technology Center Yageo Corporation Nantze Branch
関連論文
- Mn-Doped BaO-(Nd_,Sm_)_2O_3-4TiO_2 Ceramic Sintered in a Reducing Atmosphere
- Effect of Inner Electrode on Reliability of (Zn,Mg)TiO_3-Based Multilayer Ceramic Capacitor
- Effect of Inner Electrode on Electrical Properties of (Zn,Mg)TiO_3-Based Multilayer Ceramic Capacitor
- Effect of Inner Electrode on Reliability of (Zn,Mg)TiO3-Based Multilayer Ceramic Capacitor
- Effect of Inner Electrode on Electrical Properties of (Zn,Mg)TiO3-Based Multilayer Ceramic Capacitor
- Mn-Doped BaO–(Nd0.7,Sm0.3)2O3–4TiO2 Ceramic Sintered in a Reducing Atmosphere
- Characterization of ZnO-Based Multilayer Varistor Sintered by Hot-Press Sintering