Raman Scattering Characterization of the Crystalline Qualities of ZnSe Films Grown on S-Passivated GaAs(100) Substrates

スポンサーリンク

概要

• 論文の詳細を見る
• 1995-08-21

著者

• Wang Xun

  Surface Physics Laboratory Fudan University

• WANG J.

  Surface Physics Laboratory, Fudan University

• LIU X.

  Surface Physics Laboratory, Fudan University

• LI Z.

  Surface Physics Laboratory, Fudan University

• LING Z.

  Surface Physics Laboratory, Fudan University

• HOU X.

  Surface Physics Laboratory, Fudan University

• Ling Z.

  Surface Physics Laboratory Fudan University

関連論文

• Near Band-Edge Photoluminescence in Strained and Relaxed Si_Ge_x/Si Quantum Wells
• Oxygen δ-Doped Si Multi-Layers Grown by Molecular Beam Epitaxy
• Crystalline Si/SiO_x Multilayer Structure Grown by Molecular Beam Epitaxy
• Characterization of Silicon Nitride Thin Films on Si and Overlayer Growth of Si and Ge
• Raman Scattering Characterization of the Crystalline Qualities of ZnSe Films Grown on S-Passivated GaAs(100) Substrates
• Light-Emitting Porous Silicon Prepared by Pulsed Anodic Etching
• Characterization of Silicon Nitride Thin Films on Si and Overlayer Growth of Si and Ge

スポンサーリンク