An Amorphous Avalanche Photo-Diode with a Large Conduction Band Edge Discontinuity
スポンサーリンク
概要
- 論文の詳細を見る
- 1995-08-21
著者
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Sugawa Shigetoshi
Device Development Center Canon Inc.
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Tokunaga Hiroyuki
Device Development Center Canon Inc.
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Ohmi K
Device Development Center Canon Inc.
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Atoji Tadashi
Device Development Center Canon Inc.
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KOZUKA Hiraku
Device Development Center, CANON INC.
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SHIMIZU Hisae
Device Development Center, CANON INC.
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OHMI Kazuaki
Device Development Center, CANON INC.
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Ohmi Kazuaki
Device Development Center Canon Inc.
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Shimizu Hisae
Device Development Center Canon Inc.
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Kozuka Hiraku
Device Development Center Canon Inc.
関連論文
- Silicon Wafer Orientation Dependence of Metal Oxide Sermiconductor Device Reliability
- An Amorphous Avalanche Photo-Diode with a Large Conduction Band Edge Discontinuity
- Amorphous Avalanche Photodiode with Large Conduction Band Edge Discontinuity