An Accurate Impact Ionization Current Model for LDD SOI MOSFETs
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概要
- 論文の詳細を見る
- 1995-08-21
著者
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MATSUMOTO T.
Department of Physics, Kyoto University
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PIDIN S.
Department of Machine Intelligence and System Engineering, Tohoku University
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TERAO N.
Ricoh Corporation
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Pidin S.
Department Of Machine Intelligence And System Engineering Tohoku University
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Pidin S.
Department Of Machine Intelligence And System Engineering Faculty Of Engineering Tohoku University
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Koyanagi M.
Department Of Bioengineering And Robotics Tohoku University
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TERAO N.
Department of Machine Intelligence and System Engineering, Faculty of Engineering, Tohoku University
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INOUE Y.
Mitsubishi Electric Corporation, ULSI Laboratory
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Koyanagi M.
Department Of Machine Intelligence And System Engineering Tohoku University
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Matsumoto T.
Department of Animal Husbandry, Faculty of Agriculture, Tohoku University
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