Single, Individual Traps at the SiO_2/Si Interface in Sub-μm MOSFETs
スポンサーリンク
概要
- 論文の詳細を見る
- 1995-08-21
著者
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Mueller H.
Institute Of Applied Physics University Of Erlangen-nurnberg
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SCHULZ M.
Institute of Applied Physics, University of Erlangen-Nurnberg
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SCHIRL U.
Institute of Applied Physics, University of Erlangen-Nurnberg
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Schirl U.
Institute Of Applied Physics University Of Erlangen-nurnberg
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Schulz M.
Institute Of Applied Physics University Of Erlangen-nurnberg