Highly Reliable Ultra Thin Gate Dielectrics for Dual-Gate CMOS Devices

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概要

論文の詳細を見る
1995-08-21

著者

Kwong D.
Microelectronics Research Center Department Of Electrical & Computer Engineering And Materials S
Kwong D.
Microelectronics Research Center Department Of Electrical And Computer Engineering University Of Tex
HAN L.
Microelectronics Research Center, Department of Electrical and Computer Engineering University of Te
WRISTERS D.
Microelectronics Research Center, Department of Electrical and Computer Engineering University of Te
CHEN T.
Microelectronics Research Center, Department of Electrical and Computer Engineering University of Te
LIN C.
Microelectronics Research Center, Department of Electrical and Computer Engineering University of Te
CHEN K.
Microelectronics Research Center, Department of Electrical and Computer Engineering University of Te
FULFORD J.
Advanced Micro Devices
Wristers D.
Microelectronics Research Center Department Of Electrical And Computer Engineering University Of Tex

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