Metrological Applications of Single Electron Tunneling
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概要
- 論文の詳細を見る
- 1996-08-26
著者
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ZIMMERMAN Neil
National Institute of Standards and Technology
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Steinbach Andrew
National Institute Of Standards And Technology
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MARTINIS John
National Institute of Standards and Technology
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KELLER Mark
National Institute of Standards and Technology
関連論文
- Turnstile Operation Using a Silicon Dual-Gate Single-Electron Transistor
- Metrological Applications of Single Electron Tunneling
- Turnstile Operation Using a Silicon Dual-Gate Single-Electron Transistor