Ultra-Low Ressitance, Through-Wafer Via (TWV) Technology and Its Applications in Three Dimensional Structures on Silicon
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概要
- 論文の詳細を見る
- 1998-09-07
著者
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Lee Thomas
E. L. Ginzton Laboratory And Center For Integrated Systems Stanford University
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Mccarthy Anthony
Lawrence Livermore National Laboratory
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Yue C.patrick
E. L. Ginzton Laboratory And Center For Integrated Systems Stanford University
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SOH Hyongsok
E. L. Ginzton Laboratory and Center for Integrated Systems, Stanford University
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RYU Changsup
E. L. Ginzton Laboratory and Center for Integrated Systems, Stanford University
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QUATE Calvin
E. L. Ginzton Laboratory and Center for Integrated Systems, Stanford University
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SOH Hyongsok
E.L. Ginzton Laboratory and Center for Integrated Systems, Stanford University
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YUE C.
E.L. Ginzton Laboratory and Center for Integrated Systems, Stanford University
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RYU Changsup
E.L. Ginzton Laboratory and Center for Integrated Systems, Stanford University
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LEE Thomas
E.L. Ginzton Laboratory and Center for Integrated Systems, Stanford University
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QUATE Calvin
E.L. Ginzton Laboratory and Center for Integrated Systems, Stanford University
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Ryu Changsup
E. L. Ginzton Laboratory And Center For Integrated Systems Stanford University
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Soh Hyongsok
E. L. Ginzton Laboratory And Center For Integrated Systems Stanford University
関連論文
- Ultra-Low Resistance, Through-Wafer Via (TWV) Technology and Its Applications in Three Dimensional Structures on Silicon
- Ultra-Low Ressitance, Through-Wafer Via (TWV) Technology and Its Applications in Three Dimensional Structures on Silicon