Defect Effect on Electrical Transport of Multiwalled Carbon Nanotubes

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概要

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• The low-temperature transport properties of individual multiwalled carbon nanotubes are investigated at low temperatures using the multiple-probe technique. A low-ohmic contact between an electrode and a tube is prepared to prevent the influence of contact. Measurements using two- and four-probe techniques show Coulomb oscillations with nearly the same periods, indicating that the tunneling barriers are inside the tubes between each pair of electrodes. The experiment and the theoretical simulation suggest the existence of local barriers being responsible for the formation of a chain of weakly coupled islands and for the observed Coulomb blockade characteristics.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2005-06-15

著者

• Chen Chiidong

  Institute Of Physics Academia Sinica

• Hsiou Yu-Feng

  Graduate Institute of Electronics Engineering and Department of Electrical Engineering, National Tai

• Chan Ching-Hsu

  Department of Information Management, St. John’s and St. Mary’s Institute of Technology, Taipei, Tam

• Stobinski Leszek

  Institute of Physics, Academia Sinica, Taipei, Nankang 11529, Taiwan, Republic of China

• Yang Ying-Jay

  Graduate Institute of Electronics Engineering and Department of Electrical Engineering, National Tai

• Yang Ying-jay

  Graduate Institute Of Electronics Engineering And Department Of Electrical Engineering National Taiw

• Hsiou Yu-feng

  Graduate Institute Of Electronics Engineering And Department Of Electrical Engineering National Taiw

• Chan Ching-hsu

  Department Of Information Management St. John's And St. Mary's Institute Of Technology

• Stobinski Leszek

  Institute Of Physics Academia Sinica

関連論文

• Defect Effect on Electrical Transport of Multiwalled Carbon Nanotubes

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