Deep Sub-Micron Device and Analog Circuit Parameter Sensitivity to Process Variations with Halo Doping and Its Effect on Circuit Linearity

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2005-04-30

著者

• Narasimhulu K.

  Electrical Engineering Department Indian Institute Of Technology Bombay

• RAMGOPAL RAO

  Electrical Engineering Department, Indian Institute of Technology Bombay

関連論文

• Deep Sub-Micron Device and Analog Circuit Parameter Sensitivity to Process Variations with Halo Doping and Its Effect on Circuit Linearity
• Deep Sub-Micron Device and Analog Circuit Parameter Sensitivity to Process Variations with Halo Doping and Its Effect on Circuit Linearity

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