Stress on Junction-Down-Mounted Ridge-Waveguide Laser Diodes

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概要

• 論文の詳細を見る

• A novel way of evaluating thermal stress on junction-down-mounted ridge-waveguide laser diodes is proposed and demonstrated. Namely, spatially resolved electroluminescence and photoluminescence observations revealed that a localized stress of $2.2\times 10^{7}$ Pa led to gradual degradation during aging.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2005-04-15

著者

• SHIMAOKA Makoto

  Mechanical Engineering Research Laboratory, Hitachi Ltd.

• Nakahara Koji

  Central Research Laboratory Hitachi Ltd.

• Nomoto Etsuko

  Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-Koigakubo, Kokubunji, Tokyo 185-8601, Japa

• Nomoto Etsuko

  Central Research Laboratory Hitachi Ltd.

• Shimaoka Makoto

  Mechanical Engineering Research Laboratory Hitachi Ltd.

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