Development of a sub-eV resolution soft-X-ray spectrometer for a transmission electron microscope
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 2001-04-01
著者
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TANAKA Michiyoshi
Research Institute for Scientific Measurements, Tohoku University
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TERAUCHI Masami
Research Institute for Scientific Measurements, Tohoku University
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Terauchi Masami
Research Institute For Scientific Measurements Tohoku University
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Tanaka M
Research Institute For Scientific Measurements Tohoku University
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YAMAMOTO Hideto
Research Institute for Scientific Measurements, Tohoku University
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Yamamoto Hideto
Research Institute For Scientific Measurements Tohoku University
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Tanaka Michiyoshi
Research Institute For Scientific Measurements Tohoku University
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