Measurement of electron beam broadening in stainless steels during EDS analysis in the FEG-TEM

スポンサーリンク

概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 2001-04-01

著者

• Okada O

  Anelva Corp. Tokyo Jpn

• Nakata K

  Hitachi Ltd. Ibaraki Jpn

• Ueki Yasumitsu

  Techno Research Laboratory Hitachi Instruments Engineering Co. Ltd

• NAKATA Kiyotomo

  The Second Department of Materials, Hitachi Research Laboratory, Hitachi Ltd

• OKADA Osamu

  The Second Department of Materials, Hitachi Research Laboratory, Hitachi Ltd

• UEKI Yasumitsu

  Hitachi Science Systems, Ltd

関連論文

• Multi-Beam Optical Disk Drive for High Data Transfer Rate Systems : Drive Technology
• Multi-Beam Optical Disk Drive for High Data Transfer Rate Systems
• Effects of foil thickness on measurement of grain boundary segregation with FEG-TEM/EDS in austenitic stainless steels
• Reaction of Copper Oxide and β-Diketone for In situ Cleaning of Metal Copper in a Copper Chemical Vapor Deposition Reactor
• Deposition Rate and Gap Filling Characteristics in Cu Chemical Vapor Deposition with Trimethylvinylsilyl Hexafluoro-acetylacetonate Copper (I)
• Measurement of electron beam broadening in stainless steels during EDS analysis in the FEG-TEM

スポンサーリンク