Sinusoidal Phase-Modulating Superluminescent Diode Interferometer with Fabry-Perot Etalone for Step-Profile Measurement
スポンサーリンク
概要
- 論文の詳細を見る
- 1999-02-01
著者
-
Tsuji Kenichiro
Graduate School Of Science And Technology Niigata University
-
Sasaki Osami
Faculty Of Engineering Niigata University
-
SUZUKI Takamasa
Faculty of Engineering, Niigata University
-
Suzuki Takamasa
Faculty Of Engineering Niigata University
関連論文
- Measurement of Layer Thickness Using Spread Width of Longitudinal Image in Helical CT
- Sinusoidal Phase-Modulating Superluminescent Diode Interferometer with Fabry-Perot Etalone for Step-Profile Measurement
- Photothermal Phase-Modulating Laser Diode Interferometer with High-Speed Feedback Control
- Parallel Plate Interferometer with a Reflecting Mirror for Measuring Angular Displacement
- Grating Interferometer Using ±1st Order Beams for Step-Profile Altitude Difference Measurement
- A Tunable External Cavity Laser Diode Possessing a Stable Wavelength
- Measurement of Sectional Profile of a Cylinder using a Sinusoidally Vibrating Light with Sinusoidal Intensity
- Thickness and Surface Profile Measurement by a Sinusoidal Wavelength-Scanning Interferometer