Image contrast of ultra HVEM and future ultra HREM

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 2000-02-01

著者

• HASHIMOTO Hatsujiro

  Okayama University of Science

関連論文

• Surface Topography of Ion-Etched Si Wafers Studied by Electron Microscopy
• Electron Microscope Observation of Au/Si (111) Interface in Atomic Level
• Image contrast of ultra HVEM and future ultra HREM

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