Improvement of resolution by maximum entropy linear image restoration for NiSi_2/Si interface

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概要

著者

Wang J.
Materials R & D Center
CHEN Fu
Center of Electron Microscopy, Dept of Engineering and System Science, National Tsing Hua University
KAI J.
Center of Electron Microscopy, Dept of Engineering and System Science, National Tsing Hua University
CHANG L.
Dept of Materials Science and Engineering, National Chiao-Tung University
CHEN W.
Dept of Mechanical Materials Engineering, National Yun-Lin Polytechnic Institute
Kai J.
Center Of Electron Microscopy Dept Of Engineering And System Science National Tsing Hua University
Kai J.j.
Center Of Tem Dept.of Engineering And System Science National Tsing Hua University
Chen W.
Dept Of Mechanical Materials Engineering National Yun-lin Polytechnic Institute
Chen Fu
Center Of Electron Microscopy Dept Of Engineering And System Science National Tsing Hua University
Chen Fu-rong
Center Of Tem Dept.of Engineering And System Science National Tsing Hua University
Kai J.J.
Center of Electron Microscopy, Dept of Engineering and System Science, National Tsing Hua University
Chen Fu-Rong
Center of Electron Microscopy, Dept of Engineering and System Science, National Tsing Hua University

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