Failure analysis of laser diodes by SEM and TEM
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1999-12-01
著者
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Yabuuchi Yasufumi
Characterization Technology Group Matsushita Technoresearch Inc.
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Yabuuchi Yasufumi
Characterization Technology Group Matsushita Technoresearch Inc
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INAZATO Sachiko
Characterization Technology Group, Matsushita Technoresearch, Inc
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Inazato Sachiko
Characterization Technology Group Matsushita Technoresearch Inc
関連論文
- Failure analysis of laser diodes by SEM and TEM
- A study of the damage on FIB-prepared TEM samples of Al_xGa_As