High-resolution in-situ transmission electron microscopy observation of a solid-liquid interface in the Al-Si system
スポンサーリンク
概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1999-08-01
著者
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SAKA H.
Department of Materials Science and Engineering, Faculty of Engineering, Nagoya University
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Tsukimoto S.
Department Of Quantum Engineering
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Saka H.
Department Of Quantum Engineering
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ARAI S.
Center for Integrated Research in Science and Engineering
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MIYAI H.
Department of Materials Science and Engineering, Nagoya University
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Saka H.
Department Of Materials Science And Engineering Faculty Of Engineering Nagoya University
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Miyai H.
Department Of Materials Science And Engineering Nagoya University
関連論文
- Vibrational Motion of Grain Boundary in Intermetallic Compound Induced by Electron Beam Irradiation
- High-resolution in-situ transmission electron microscopy observation of a solid-liquid interface in the Al-Si system
- FIB/HVEM observation of the configuration of cracks and the defect structure near the cracks in Si
- Defect structure development in electron irradiated Cu-Pd and Cu-Pt alloys with HVEM