Optimization of TEM specimen preparation by double-sided ion beam thinning under low angles

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 1999-06-01

著者

• Baretzky B.

  Max-planck-institut Fur Metallforschung

• Ruhle M.

  Max-Planck-Institut fur Metallforschung

• STRECKER A.

  Max-Planck-Institut fur Metallforschung

• MAYER J.

  Max-Planck-Institut fur Metallforschung

• EIGENTHALER U.

  Max-Planck-Institut fur Metallforschung

• GEMMING TH.

  Max-Planck-Institut fur Metallforschung

• SCHWEINGEST R.

  Max-Planck-Institut fur Metallforschung

関連論文

• Quantitative diffractometry at 0.1 nm resolution for testing lenses and recording media of a high-voltage atomic resolution microscope
• Optimization of TEM specimen preparation by double-sided ion beam thinning under low angles

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