TEM Observation of Microstructures in RF-Sputtered Sm-Fe Magnetic Thin Films
スポンサーリンク
概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1996-10-01
著者
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Tomida Toshiro
Fundamental Research Department Corporate Research And Development Laboratories
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Kamei Kazuhito
Electronics Engineering Laboratories Sumitomo Metal Industries Ltd.
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Kamei Kazuhito
Electronics Materials Science Department Advanced Technology Research Laboratories Sumitomo Metal In
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Itoh Yutaka
Electronics Materials Science Department Advanced Technology Research Laboratories Sumitomo Metal In
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SUN Hong
Fundamental Research Department, Corporate Research and Development Laboratories
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HANAFUSA Kenji
Electronics Materials Science Department, Advanced Technology Research Laboratories, Sumitomo Metal
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Hanafusa Kenji
Electronics Materials Science Department Advanced Technology Research Laboratories Sumitomo Metal In
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Sun Hong
Fundamental Research Department Corporate Research And Development Laboratories
関連論文
- Analysis of Local Lattice Strain Around Oxygen Precipitates in Czochralski-Grown Silicon Wafers Using Convergent Beam Electron Diffraction
- Tunnel-type Giant Magnetoresisitance in Co–Al–Ta–O Insulated Granular System
- TEM Observation of Microstructures in RF-Sputtered Sm-Fe Magnetic Thin Films