The Necessity and Utlity of a Scanning Electron Microscope with 4,096 Lines

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 1995-10-01

著者

• Oho E

  Kogakuin Univ. Tokyo Jpn

• Oho Eisaku

  Department Of Electrical Engineering Kogakuin University

• Ogashiwa Takeshi

  Department Of Electrical Engineering Kogakuin University

• Ichise N

  Univ. Tokyo Tokyo Jpn

• Ichise Norihiko

  Department Of Electrical Engineering Kogakuin University

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• Image quality improvement using helium gas in low voltage variable pressure scanning electron microscopy
• An auto-tuning method for focusing and astigmatism correction in HAADF-STEM, based on the image contrast transfer function
• The Necessity and Utlity of a Scanning Electron Microscope with 4,096 Lines
• Image Area Extraction of Biological Objects from a Thin Section Image by Statistical Texture Analysis

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