Unified MOSFT Model for All Channel Lengths down to Quarter Micron
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概要
- 論文の詳細を見る
- 1992-02-25
著者
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Miura-mattausch Mitiko
Siemens Ag Corporate Research And Development
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Weinert Ulrich
Siemens Ag Corporate Research And Development
関連論文
- Analytical Model for Circuit Simulation with Quarter Micron Metal Oxide Semiconductor Field Effect Transistors : Subthreshold Characteristics
- Unified MOSFT Model for All Channel Lengths down to Quarter Micron