PRECISE MESUREMENT OF THE PHOTOABSORPTION CROSS SECTION OF Xe IN THE SOFT X-RAY REGION

スポンサーリンク

概要

• 論文の詳細を見る

著者

• Saito Norio

  Electronic Components Department Magnetic Devices Division Components Company Sony Corporation

• H. Suzuki

  Electrotechnical Laboratory

関連論文

• Vertical Magnetoresistive / Inductive Head
• Development of a Magnetoresistive / Inductive Head and Low Noise Amplifier IC for High Density Rigid Disk Drives (Special Section of Letters Selected from the 1993 IEICE Spring Conference)
• Absolute Intensity of Soft X-Rays of Synchrotron Radiation from the ETL-Storage Ring
• Ionic Fragmentation of CF_3Cl Photoexcited in the Cl L-Shell, C K-Shell, and F K-Shell Transition Regions
• FRAGMENTAION OF METHYL FORMATE FOLLOWING CARBON 1s ELECTRON EXCITATION
• PHOTON W-VALUE FOR Ar IN THE L-SHELL TRANSITION REGION
• FRAGMENT ION YIELDS FROM ACETONE PHOTOEXCITED IN THE C1s AND O1s TRANSITION REGIONS
• COINCIDENCE MEASUREMENT BETWEEN ENERGY-SELECTED ELECTRONS AND MULTI-CHARGED IONS USING A SPHERICAL MIRROR ANALYZER
• Double Auger Probabilities from Xe 4d_j,Kr3d_j,and Ar2p_j Hole States
• PRECISE MESUREMENT OF THE PHOTOABSORPTION CROSS SECTION OF Xe IN THE SOFT X-RAY REGION

スポンサーリンク