Double Auger Probabilities from Xe 4d_j,Kr3d_j,and Ar2p_j Hole States
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概要
- 論文の詳細を見る
The yield ratios of triply charged ions to doubly charged tons prodtrced frotn Xe" with 4d3 /2and 4d5 /2 holes, frona Kr' with 3d3 77 and 3d5 /2 holes, and frotn Ar' with 2p3 77 and 2p3 73 holeshave been measured tmsing a coincidence techniqtme between an energy-selected photoelectron anda charge-specified ion. The difference in the ratios of' the double to the norraaal Auger transitionsf'rorn the 2p3 77 and 2p) /2 hole states in Ar" and that in the rattios f'rom the 3(l/5 /2 and 3d3 /2 holestates in Kr" are stnall. However the difl'erence in tJaose f'ronn the 4d57. and 4d37. hole statesin Xe" is significant. This difference probaToly originates f'ronu tire fact that the energy of theground state of Xe" is jttst beloxv that of the 4d57) hole state of Xe", i.e., the difl'erence in theexcess errergy and the ntrrnber of' availalcle states pi?ty a critical role in the transition.
- 社団法人日本物理学会の論文
- 1997-07-15
著者
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SUZUKI Isao
Electrotechnical Laboratory
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Saito Norio
Electronic Components Department Magnetic Devices Division Components Company Sony Corporation
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Saito Norio
Electrotechnical Laboratory
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Suzuki H.
Electrotechnical Laboratory
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