Experimental Studies of 90°Bragg Reflection from a Sub-Micron In_xGa_<1-x>As Single-Crystal Film Deposited on a GaAs Substrate
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-02-01
著者
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Tamasaku Kenji
Coherent X-ray Optics Laboratory Harima Institute Riken/spring-8
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NIKULIN Andrei
Department of Physics, Monash University
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USHER Brian
Department of Electronic Engineering, La Trobe University
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ISHIKAWA Tetsuya
Coherent X-Ray Optics Laboratory, Harima Institute, RIKEN/SPring-8
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Usher Brian
Department Of Electronic Engineering La Trobe University
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Nikulin Andrei
Department Of Physics Monash University
関連論文
- Experimental Studies of 90°Bragg Reflection from a Sub-Micron In_xGa_As Single-Crystal Film Deposited on a GaAs Substrate
- Experimental Studies of 90° Bragg Reflection from a Sub-Micron InxGa1-xAs Single-Crystal Film Deposited on a GaAs Substrate
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