Characterization of Homogeneity of Langasite Wafers Using Bulk-Wave Measurement

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概要

• 論文の詳細を見る
• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 2001-05-01

著者

• Wang Shou-qi

  Electronics Device R & D Center Mitsubishi Material Co. Ltd.

• Uda Satoshi

  Electronics Device R & D Center Mitsubishi Material Co. Ltd.

関連論文

• Characterization of Homogeneity of Langasite Wafers Using Bulk-Wave Measurement
• A Wireless Surface Acoustic Wave Temperature Sensor Using Langasite as Substrate Material for High-Temperature Applications
• Effects of Electrode Materials On Natural Unidirectionality of Langasite
• Growth of 3-inch Langasite Single Crystal and Its Application to Substrate for Surface Acoustic Wave Filters
• A Wireless Surface Acoustic Wave Temperature Sensor Using Langasite as Substrate Material for High-Temperature Applications

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