Microstructure of Al-Zr and Al-Nb Alloy Thin Films for TET-LCD Gate Electrodes
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概要
- 論文の詳細を見る
- Japan Institute of Metalsの論文
- 2000-07-20
著者
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Takayama Shinji
Department Of Information Networking Osaka University
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Takayama Shinji
Department Of Systems And Control Engineering Hosei University
関連論文
- Optical Wave-Band Switching Scheme and Its Wave-Band Design Method(Photonic IP Network Technologies for Next Generation Broadband Access)
- Effects of Oxygen Gas Annealing on Electrical Properties and Internal Stress in Indium Tin Oxide Films : Semiconductors
- Microstructure of Al-Zr and Al-Nb Alloy Thin Films for TET-LCD Gate Electrodes