Two-Color Reflection Multilayers for He-I and He-II Resonance Lines for Microscopic Ultraviolet Photoelectron Spectroscopy Using Schwarzschild Objective

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概要

• 論文の詳細を見る
• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 2001-01-15

著者

• Ejima Takeo

  Research Institute For Scientific Measurements Tohoku University

• KONDO Yuzi

  Research Institute for Scientific Measurements, Tohoku University

• WATANABE Makoto

  Research Institute for Scientific Measurements, Tohoku University

関連論文

• Two-Color Reflection Multilayers for He-I and He-II Resonance Lines for Microscopic Ultraviolet Photoelectron Spectroscopy Using Schwarzschild Objective
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• Effects of the Core Hole Potential on the B 1s Emission in Hexagonal BN
• A Soft-X-Ray Imaging Microscope with a Multilayer-Coated Schwarzschild Objective : Imaging Tests
• Laboratory Extreme-Ultraviolet Faraday-Rotation Apparatus Using Multilayer Polarizers
• Buried Interfaces in Mo/Si Multilayers Studied by Soft-X-Ray Emission Spectroscopy
• Zero-Order-Free, Multilayer-Coated Laminar Grating in the 31 nm Region

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