Crystal Orientation and Surface Roughness of Bi Films Prepared in Ionized Cluster Beam Apparatus
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概要
- 論文の詳細を見る
- 1996-02-01
著者
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NAKADA Masafumi
Functional Devices Research Laboratories, NEC Corp.
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OKADA Mitsuya
Functional Devices Research Laboratories, NEC Corp.
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Okada M
Functional Devices Research Laboratories Nec Corporation
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Okada Mitsuya
Functional Devices Research Laboratories Nec Corp.
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Nakada Masafumi
Functional Devices Research Laboratories Nec Corporation
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Nakada Masafumi
Functional Devices Research Laboratories Nec Corp.
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OHSHIMA Norikazu
Functional Devices Research Laboratories, NEC Corporation
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Ohshima Norikazu
Functional Devices Research Laboratories Nec Corporation
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- Disk Noise of Quadrilayer MnBi Magneto-Optical Disks
- Effects of Silicon Nitride Chemical Composition on Magneto-Optical Properties of Non-Stoichiometric Silicon Nitride/TbFeCo Layers
- Crystal Orientation and Surface Roughness of Bi Films Prepared in Ionized Cluster Beam Apparatus
- Read/Write Characteristics of MnBi Magneto-Optical Disk Fabricated on Photo-Polymer Substrate
- Structural and Magnetic Properties of Ni-O/Ni-Fe Bilayer Films
- Crystal Orientation and Surface Roughness of Bi Films Prepared in Ionized Cluster Beam Apparatus
- Phase Change Optical Disks Having Recording Marks with Large Optical Phase Difference Suitable for Mark Edge Recording