スポンサーリンク
Toyota Technological Institute, 2-12-1 Hisakata, Tenpaku-ku, Nagoya 468-8511, Japan | 論文
- Study of the Degradation of p–n Diode Characteristics Caused by Small-Angle Grain Boundaries in Multi-Crystalline Silicon Substrate for Solar Cells
- Improvement of Compact Electron-Beam-Excited Plasma Source for Increased Producible Plasma Density