Study of the Degradation of p–n Diode Characteristics Caused by Small-Angle Grain Boundaries in Multi-Crystalline Silicon Substrate for Solar Cells

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概要

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• The causes of degradation of electrical characteristics, which affect the energy conversion efficiency of solar cells, were evaluated using a small p–n diode array fabricated on a multi-crystalline silicon (mc-Si) substrate. Many of the current–voltage ($I$–$V$) characteristics of diodes with grain boundaries deteriorated. However, some deteriorated diodes without grain boundaries were also found. We especially evaluated the diodes to determine the causes of degradation by electron-beam-induced current (EBIC) imaging, photoluminescence (PL) mapping, transmission electron microscopy (TEM), and electron backscatter diffractometry (EBSD). As a result, it was clarified that the electrical characteristics severely deteriorated with the existence of small-angle grain boundaries. Mc-Si solar cell efficiency was significantly affected by not only obvious grain boundaries but also small-angle grain boundaries consisting of periodically aligned dislocations and possibly metallic and oxygen impurities.

• 2009-12-25

著者

• Ogura Atsushi

  School Of Science And Engineering Meiji University

• ARAFUNE Koji

  University of Hyogo

• Ohshita Yoshio

  Toyota Technological Inst. Nagoya Jpn

• Arafune Koji

  University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2280, Japan

• Ohshita Yoshio

  Toyota Technological Institute, 2-12-1 Hisakata, Tenpaku-ku, Nagoya 468-8511, Japan

• Masuda Junichi

  School of Science and Technology, Meiji University, 1-1-1 Higashimita, Tama-ku, Kawasaki 214-8571, Japan

• Tachibana Tomihisa

  School of Science and Technology, Meiji University, 1-1-1 Higashimita, Tama-ku, Kawasaki 214-8571, Japan

• Imai Keita

  School of Science and Technology, Meiji University, 1-1-1 Higashimita, Tama-ku, Kawasaki 214-8571, Japan

• Tajima Michio

  The Institute of Space and Astronautical Science (ISAS)/Japan Aerospace Exploration Agency (JAXA), 3-1-1 Yoshinodai, Sagamihara, Kanagawa 229-8510, Japan

• Ogura Atsushi

  School of Science and Technology, Meiji University, 1-1-1 Higashimita, Tama-ku, Kawasaki 214-8571, Japan

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