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Toyota Motor Corporation, Toyota, Aichi 470-0309, Japan | 論文
- Effects of Surface and Crystalline Defects on Reverse Characteristics of 4H-SiC Junction Barrier Schottky Diodes
- Estimation of Ion/Radical Flux from Mask Selectivity and Etching Rate Calibrated by Topography Simulation
- Reduction of Power Loss of Zero Current Switching Converter by Optimizing Power Devices (Special Issue : Solid State Devices and Materials (2))
- Effects of Trap Levels on Reverse Recovery Surge of Silicon Power Diode