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Tokyo Instruments Inc. | 論文
- 504 Commercial Femtosecond Micromachining System for Sub-micron/sub-millimeter Scale Patterning
- A30 Strain field in Si mold on UV-nanoimprint lithography(M4 processes and micro-manufacturing for science)
- Optical Micro-Characterization of Single-Walled Carbon Nanotubes Extracted from AFI Crystals by Visible Emission and Raman Scattering
- (励起子・ポラリトン・表面・薄膜,領域5)