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Samsung Electronics Kyungki‐do Kor | 論文
- The Effect of Al/Pt Interface Reaction on Lead-zirconate-titanate Capacitor and the Optimization of Via Contact for Double Metal Ferroelectric RAM
- An Optimized Via Contact Scheme of FeRAM for Double-Level Metallization and Beyond
- Pyroelectric Properties of Lead Antimony Stannate-Lead Titanate-Lead Zirconate Ceramics Modified with La amd Mn