スポンサーリンク
Research and Utilization Division, Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, Sayo, Hyogo 679-5198, Japan | 論文
- X-Ray Evaluation of Microroughness of Mechanochemically Polished Silicon Surfaces
- Characterization of SiGe Layer during Ge Condensation Process by X-ray Diffraction Methods
- Structural characterization of Ar[+]-irradiated SrTiO3 showing room-temperature blue luminescence
- Dynamical X-Ray Diffraction Profiles for Asymmetric Reflection form Crystals under Grazing Incidence Conditions : Techniques, Instrumentations and Measurement
- Direct Observation of $B$-site Ordering in Multiferroic Bi2NiMnO6 Thin Film
- Surface X-ray Scattering of Pd(111) and Pd(100) Electrodes during the Oxygen Reduction Reaction