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Research and Development Center, TOSHIBA Corporation | 論文
- A Thin Film of an Ni-NiO Heterogeneous System for an Optical Recording Medium
- A Partial Response Maximum Likelihood Simulator to Evaluate the Effects of Various Deterioration Factors in Optical Disks
- Growth of High-Quality AlN and AlN/GaN/AlN Heterostructure on Sapphire Substrate
- Method for determining degassing constant of xenon in liquid sodium.
- Calculation of Radiation Wave Expanded in Series of Circular Waveguide Mode Functions